Implementation of flash analog-to-digital converters in by Erik Sall.

By Erik Sall.

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Extra info for Implementation of flash analog-to-digital converters in silicon-on-insulator CMOS technology

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6(a).

A comparator. 2(a). 5. 5, and zero otherwise. 2(b). 5 to one. , a sinusoid is applied to the comparator input the output will contain several tones, since the transfer function is nonlinear. 3(a), where you clearly see the tones generated by the nonlinearities of the comparator. Hence to say that the output resembles uniformly distributed noise is not a good approximation in the case of a 1-bit ADC. When increasing the resolution of the ADC the tones in the output will spread over the whole spectrum, as would be the case for a uniformly distributed quantization error.

Device cannot be charged, and several of the unwanted effects appearing in the partially depleted devices are thereby avoided. However, other obstacles exist of which the difficulty of manufacturing is the most important [64]. Since the active thin-film silicon layer must be very thin, its statistical variation of relative thickness over the chip is large. Further, the threshold voltage of the device depends on the thin-film thickness. Consequently, the thin-film thickness variation results in varying threshold voltages over the chip [20].

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